Gsfp

Data Structures

struct igsc_device_mbist_ppr_status
struct igsc_ppr_status

enum igsc_ppr_test_status_mask { IGSC_PPR_STATUS_TEST_EXECUTED_MASK = 0x1, IGSC_PPR_STATUS_TEST_SUCCESS_MASK = 0x2, IGSC_PPR_STATUS_FOUND_HW_ERROR_MASK = 0x4, IGSC_PPR_STATUS_HW_ERROR_REPAIRED_MASK = 0x8 }

Functions

IGSC_EXPORT int igsc_memory_ppr_devices (IN struct igsc_device_handle *handle, OUT uint32_t *device_count)
Retrieves GFSP number of memory PPR devices.
IGSC_EXPORT int igsc_memory_ppr_status (IN struct igsc_device_handle *handle, OUT struct igsc_ppr_status *ppr_status)
Retrieves GFSP memory PPR status structure data.

Igsc_ifr_run_test_statuses

The IFR Run Test Command Statuses

enum ifr_test_run_status { IFR_TEST_STATUS_SUCCESS = 0, IFR_TEST_STATUS_PASSED_WITH_REPAIR, IFR_TEST_STATUS_PASSED_WITH_RECOVERY, IFR_TEST_STATUS_SUBSLICE_FAILURE, IFR_TEST_STATUS_NON_SUBSLICE_FAILURE, IFR_TEST_STATUS_ERROR }
IGSC_EXPORT int igsc_ifr_get_status (IN struct igsc_device_handle *handle, OUT uint8_t *result, OUT uint32_t *supported_tests, OUT uint32_t *ifr_applied, OUT uint8_t *tiles_num)
Retrieves the status of GSC IFR device.
IGSC_EXPORT int igsc_ifr_run_test (IN struct igsc_device_handle *handle, IN uint8_t test_type, IN uint8_t tiles, OUT uint8_t *result, OUT uint8_t *run_status, OUT uint32_t *error_code)
Runs IFR test on GSC IFR device.

Detailed Description

Data Structure Documentation

struct igsc_device_mbist_ppr_status

Device PPR status structure

Definition at line 1829 of file igsc_lib.h.

Data Fields:

uint32_t mbist_test_status 0 – Pass, Any set bit represents that MBIST on the matching channel has failed

uint32_t num_of_ppr_fuses_used_by_fw Number of PPR fuses used by the firmware

uint32_t num_of_remaining_ppr_fuses Number of remaining PPR fuses

struct igsc_ppr_status

PPR status structure

Definition at line 1838 of file igsc_lib.h.

Data Fields:

uint8_t boot_time_memory_correction_pending 0 - No pending boot time memory correction, 1 - Pending boot time memory correction

struct igsc_device_mbist_ppr_status device_mbist_ppr_status[] Array of PPR statuses per device

uint32_t mbist_completed 0 - Not Applied, Any set bit represents mbist completed

uint32_t num_devices real number of devices in the array (on Xe_HP SDV, PVC <= 8)

uint8_t ppr_mode 0 – PPR enabled, 1 – PPR disabled, 2 – PPR test mode, 3 – PPR auto run on next boot

uint32_t ras_ppr_applied 0 - ppr not applied, 1 - ppr applied, 2 - ppr exhausted

uint8_t reserved

uint8_t test_run_status test status

See also: enum igsc_ppr_test_status_mask

Enumeration Type Documentation

enum ifr_test_run_status

Enumerator

IFR_TEST_STATUS_SUCCESS: Test passed successfully
IFR_TEST_STATUS_PASSED_WITH_REPAIR: Test passed, recoverable error found and repaired. No subslice swap needed
IFR_TEST_STATUS_PASSED_WITH_RECOVERY: Test passed, recoverable error found and repaired. Subslice swap needed.
IFR_TEST_STATUS_SUBSLICE_FAILURE: Test completed, unrecoverable error found (Subslice failure and no spare Subslice available).
IFR_TEST_STATUS_NON_SUBSLICE_FAILURE: Test completed, unrecoverable error found (non-Subslice failure).
IFR_TEST_STATUS_ERROR: Test error

Definition at line 1290 of file igsc_lib.h.

enum igsc_ppr_test_status_mask

memory PPR status structures PPR test status bit masks

Definition at line 1819 of file igsc_lib.h.

Function Documentation

IGSC_EXPORT int igsc_ifr_get_status (IN struct igsc_device_handle * handle, OUT uint8_t * result, OUT uint32_t * supported_tests, OUT uint32_t * ifr_applied, OUT uint8_t * tiles_num)

Retrieves the status of GSC IFR device.

Parameters: handle A handle to the device.
result Test result code
supported_tests Bitmask holding the tests supported on the platform.
ifr_applied Bitmask holding the in field repairs was applied during boot.
tiles_num Number of tiles on the specific SOC.
Returns: IGSC_SUCCESS if successful, otherwise error code.

IGSC_EXPORT int igsc_ifr_run_test (IN struct igsc_device_handle * handle, IN uint8_t test_type, IN uint8_t tiles, OUT uint8_t * result, OUT uint8_t * run_status, OUT uint32_t * error_code)

Runs IFR test on GSC IFR device.

Parameters: handle A handle to the device.
test_type Requested test to run
result Test result code
tiles Tiles on which to run the test
run_status Test run status
error_code The error code of the test that was run (0 - no error)
Returns: IGSC_SUCCESS if successful, otherwise error code.

IGSC_EXPORT int igsc_memory_ppr_devices (IN struct igsc_device_handle * handle, OUT uint32_t * device_count)

Retrieves GFSP number of memory PPR devices.

Parameters: handle A handle to the device.
device_count pointer to number of memory PPR devices, the number is returned by the FW
Returns: IGSC_SUCCESS if successful, otherwise error code.

IGSC_EXPORT int igsc_memory_ppr_status (IN struct igsc_device_handle * handle, OUT struct igsc_ppr_status * ppr_status)

Retrieves GFSP memory PPR status structure data.

Parameters: handle A handle to the device.
ppr_status pointer to PPR status structure, which contains num_devices field representing the number of allocated items in the device_mbist_ppr_status[] array.
Returns: IGSC_SUCCESS if successful, otherwise error code.

Author

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Intel Graphics System Controller Firmware Update Library

IGSC_IFR_RUN_TEST_STATUSES - Man Page

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